From 21–25 September 2026, the 16th Conference on High-Resolution X-ray Diffraction and Imaging (XTOP 2026) brought together researchers from around the world in Karlsruhe, Germany. The conference focused on advances in X-ray diffractometry and reflectometry, coherent and conventional X-ray diffraction imaging and topography, as well as 2D and 3D X-ray imaging using phase contrast and complementary contrast mechanisms. As a leading forum for laboratory- and synchrotron-based methods, instrumentation and applications, XTOP also provides dedicated opportunities for young researchers to engage with the international scientific community.
Researchers from the Institute of Micro- and Nanostructure Research contributed to the conference with presentations on advanced X-ray imaging and tomography techniques. Doctoral researchersVeronika Schon and Maik Becker, from the research group Hierarchical Functional Materials, as well as group leader Benjamin Apeleo Zubiri, presented their latest research in oral and poster sessions. Their work is conducted within the frameworks of Collaborative Research Centre (CRC) 1411 and Research Training Group (RTG) 3103, both funded by the German Research Foundation (DFG).
Maik Becker presented the oral contribution “Crystallographic and Defect Analysis of Colloidal Photonic Supraparticles Using Zone-Axis Wide-Field XRM and NanoCT”. He also presented a poster on“CNN-Based Mitigation of Zernike Phase-Contrast Artifacts in high-resolution XRM and NanoCT”.
Veronika Schon presented her work “Contrast Engineering in NanoCT of Porous Silica through Tailored Intrusion Media” as a poster contribution, highlighting approaches to improving contrast and characterization in nano-computed tomography of porous materials.
Benjamin Apeleo Zubiri presented the oral contribution “Electron-tomography-informed super-resolved nano X-ray computed tomography”. His poster contribution, “Multiscale characterization of hierarchical particle–pore systems using correlative X-ray and electron tomography”, focused on combining complementary imaging techniques to characterize complex hierarchical materials across multiple length scales.
The participation of the Institute’s researchers at XTOP 2026 highlights ongoing research into advanced X-ray imaging and correlative tomography methods for the characterization of complex micro- and nanostructured materials.