Peter Denninger

2024

• Denninger P., Schweizer P., Spiecker E.:
  Characterization of extended defects in 2D materials using aperture-based dark-field STEM in SEM
  In: Micron 186 (2024), Article No.: 103703
  ISSN: 0968-4328
  DOI: 10.1016/j.micron.2024.103703
  BibTeX: Download

2023

• Vogl L., Kalancha V., Schweizer P., Denninger P., Wu M., Brabec C., Forberich K., Spiecker E.:
  Influence of tin oxide decoration on the junction conductivity of silver nanowires
  In: Nanotechnology 34 (2023), Article No.: 175706
  ISSN: 1361-6528
  DOI: 10.1088/1361-6528/acb3ca
  BibTeX: Download

2022

• Vogl L., Schweizer P., Denninger P., Richter G., Spiecker E.:
  Sensing Capabilities of Single Nanowires Studied with Correlative in Situ Light and Electron Microscopy
  In: ACS nano (2022)
  ISSN: 1936-0851
  DOI: 10.1021/acsnano.2c04848
  BibTeX: Download

2020

• Chen X., Denninger P., Stimpel-Lindner T., Spiecker E., Duesberg GS., Backes C., Knirsch K., Hirsch A.:
  Defect Engineering of Two-Dimensional Molybdenum Disulfide
  In: Chemistry - A European Journal (2020)
  ISSN: 0947-6539
  DOI: 10.1002/chem.202000286
  BibTeX: Download
• Schweizer P., Denninger P., Dolle C., Spiecker E.:
  Low energy nano diffraction (LEND) – A versatile diffraction technique in SEM
  In: Ultramicroscopy 213 (2020), Article No.: 112956
  ISSN: 0304-3991
  DOI: 10.1016/j.ultramic.2020.112956
  BibTeX: Download
• Zhao Y., Miao P., Elia J., Hu H., Wang X., Heumüller T., Hou Y., Matt G., Osvet A., Chen YT., Tarragó M., de Ligny D., Przybilla T., Denninger P., Will J., Zhang J., Tang X., Li N., He C., Pan A., Meixner AJ., Spiecker E., Zhang D., Brabec C.:
  Strain-activated light-induced halide segregation in mixed-halide perovskite solids
  In: Nature Communications 11 (2020), Article No.: 6328
  ISSN: 2041-1723
  DOI: 10.1038/s41467-020-20066-7
  BibTeX: Download

2019

• Schweizer P., Denninger P., Dolle C., Rechberger S., Spiecker E.:
  Low Energy Nano Diffraction (LEND) – Bringing true Diffraction to SEM
  In: Microscopy and Microanalysis (2019)
  ISSN: 1431-9276
  DOI: 10.1017/S1431927619002988
  BibTeX: Download