Skip navigation
Skip to navigation
Skip to the bottom

Simulate organization breadcrumb open Simulate organization breadcrumb close

Please enter the search term for searching into the documents of this website:

Suche öffnen

Campo
StudOn
FAUdir
Jobs
Map
Help

Navigation Navigation close

Teaching
Bachelor
Master
Portal Teaching
Research
Publications
Facilities
Research areas
Portal Research
About Us
Current members
Alumni
Job offers
Contact
Portal About us

Home
Protected: Correlative TEM-Raman study exposes unexpected stacking phases and dislocations in bilayer MoS₂

Protected: Correlative TEM-Raman study exposes unexpected stacking phases and dislocations in bilayer MoS₂

Protected: Correlative TEM-Raman study exposes unexpected stacking phases and dislocations in bilayer MoS₂

July 8, 2025

This content is password protected. To view it please enter your password below:

Password:

Category: Allgemein, News, Papers

Post navigation

Correlative X-ray and Electron Tomography Workflow Enables Multi-Scale Analysis of Complex Particle Systems

Activities

Protected: Correlative TEM-Raman study exposes unexpected stacking phases and dislocations in bilayer MoS₂
Correlative X-ray and Electron Tomography Workflow Enables Multi-Scale Analysis of Complex Particle Systems
In Situ Electron Microscopy Reveals How Heat Shapes Stability of Pt Single Atoms on TiO₂ for Photocatalytic Hydrogen Production
IMN retreat 2025
Correlative electron microscopy, X-ray diffraction and DFT reveal the influence of substrate polarity on metal thin film growth characteristics

Institute of Micro- and Nanostructure Research
Department of Materials Science
Cauerstr. 3
91058 Erlangen

Impressum
Datenschutz
Barrierefreiheit

Facebook
RSS Feed
Twitter
Xing

Up