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  2. Protected: Correlative TEM-Raman study exposes unexpected stacking phases and dislocations in bilayer MoS₂

Protected: Correlative TEM-Raman study exposes unexpected stacking phases and dislocations in bilayer MoS₂

Protected: Correlative TEM-Raman study exposes unexpected stacking phases and dislocations in bilayer MoS₂

July 8, 2025

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Correlative X-ray and Electron Tomography Workflow Enables Multi-Scale Analysis of Complex Particle Systems

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Institute of Micro- and Nanostructure Research
Department of Materials Science

Cauerstr. 3
91058 Erlangen
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