Papers

Browse all posts in the Papers category.

43 to 45 of 45

22MAY 2017
Allgemein
In situ microscopy directly reveals dislocation formation in MAX phase
Researchers in IMN has recently reported the direct observation of nucleation and propagation of basal plane dislocations in Nb2AlC, a member of MAX phases, using nanomechanical testing inside a transmission electron microscope. MAX Phases (with M an early transition metal, A an A group element and X being either nitrogen or carbon) constitute an interesting […]
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05APR 2017
News
Novel approach for preparation of in situ tensile testing of thin silica glass membranes in the TEM
A research article “A Novel Approach for Preparation and In Situ Tensile Testing of Silica Glass Membranes in the Transmission Electron Microscope” by our colleagues Mirza Mačković, Thomas Przybilla, Christel Dieker, Patrick Herre, Stefan Romeis, Hana Stara, Nadine Schrenker, Wolfgang Peukert and Erdmann Spiecker has been accepted for publication in the journal Frontiers in Materials, […]
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$Electron refraction at high resolution and precision$
28MAR 2017
News
Electron refraction at high resolution and precision
Research article “Correlative micro-diffraction and differential phase contrast study of mean inner potential and subtle beam-specimen interaction“, by Mingjian Wu and Erdmann Spiecker, has been accepted for publication in the journal Ultramicroscopy. Probing nanometer scale electrostatic (Coulomb) potential and/or the corresponding electric field, and establishing structure- properties relationships at this length scale in advanced functional […]Research article “Correlative micro-diffraction and differential phase contrast study of mean inner potential and subtle beam-specimen interaction“, by Mingjian Wu and Erdmann Spiecker, has been accepted for publication in the journal Ultramicroscopy. Probing nanometer scale electrostatic (Coulomb) potential and/or the corresponding electric field, and establishing structure- properties relationships at this length scale in advanced functional […]
Read more about Electron refraction at high resolution and precision