Prof. Dr. rer. Nat. Philipp Pelz

2023

• Pelz P., Griffin SM., Stonemeyer S., Popple D., DeVyldere H., Ercius P., Zettl A., Scott MC., Ophus C.:
  Solving complex nanostructures with ptychographic atomic electron tomography
  In: Nature Communications 14 (2023), Article No.: 7906
  ISSN: 2041-1723
  DOI: 10.1038/s41467-023-43634-z
  BibTeX: Download
• Sari B., Zeltmann SE., Zhao C., Pelz P., Javey A., Minor AM., Ophus C., Scott MC.:
  Analysis of Strain and Defects in Tellurium-WSe2 Moiré Heterostructures Using Scanning Nanodiffraction
  In: ACS nano (2023)
  ISSN: 1936-0851
  DOI: 10.1021/acsnano.3c04283
  BibTeX: Download
• Terzoudis-Lumsden EW., Petersen TC., Brown HG., Pelz P., Ophus C., Findlay SD.:
  Resolution of Virtual Depth Sectioning from Four-Dimensional Scanning Transmission Electron Microscopy
  In: Microscopy and Microanalysis 29 (2023), p. 1409-1421
  ISSN: 1431-9276
  DOI: 10.1093/micmic/ozad068
  BibTeX: Download
• Wang Y., Chen J., Li R., Götz A., Drobek D., Przybilla T., Hübner S., Pelz P., Yang L., Apeleo Zubiri B., Spiecker E., Engel M., Ye X.:
  Controlled Self-Assembly of Gold Nanotetrahedra into Quasicrystals and Complex Periodic Supracrystals
  In: Journal of the American Chemical Society 145 (2023), p. 17902-17911
  ISSN: 1520-5126
  DOI: 10.1021/jacs.3c05299
  BibTeX: Download
• Wu M., Stroppa DG., Pelz P., Spiecker E.:
  Using a fast hybrid pixel detector for dose-efficient diffraction imaging beam-sensitive organic molecular thin films
  In: JPhys Materials 6 (2023), Article No.: 045008
  ISSN: 2515-7639
  DOI: 10.1088/2515-7639/acf524
  BibTeX: Download

2022

• Pelz PM., Groschner C., Bruefach A., Satariano A., Ophus C., Scott MC.:
  Simultaneous Successive Twinning Captured by Atomic Electron Tomography
  In: ACS nano 16 (2022), p. 588-596
  ISSN: 1936-0851
  DOI: 10.1021/acsnano.1c07772
  BibTeX: Download
• Pelz PM., Johnson I., Ophus C., Ercius P., Scott MC.:
  Real-Time Interactive 4D-STEM Phase-Contrast Imaging From Electron Event Representation Data: Less computation with the right representation
  In: IEEE Signal Processing Magazine 39 (2022), p. 25-31
  ISSN: 1053-5888
  DOI: 10.1109/MSP.2021.3120981
  BibTeX: Download

2021

• Findlay SD., Brown HG., Pelz PM., Ophus C., Ciston J., Allen LJ.:
  Scattering Matrix Determination in Crystalline Materials from 4D Scanning Transmission Electron Microscopy at a Single Defocus Value
  In: Microscopy and Microanalysis 27 (2021), p. 744-757
  ISSN: 1431-9276
  DOI: 10.1017/S1431927621000490
  BibTeX: Download
• Pelz PM., Brown HG., Stonemeyer S., Findlay SD., Zettl A., Ercius P., Zhang Y., Ciston J., Scott MC., Ophus C.:
  Phase-contrast imaging of multiply-scattering extended objects at atomic resolution by reconstruction of the scattering matrix
  In: Physical Review Research 3 (2021), Article No.: 023159
  ISSN: 2643-1564
  DOI: 10.1103/PhysRevResearch.3.023159
  BibTeX: Download
• Pelz PM., Rakowski A., Dacosta LR., Savitzky BH., Scott MC., Ophus C.:
  A Fast Algorithm for Scanning Transmission Electron Microscopy Imaging and 4D-STEM Diffraction Simulations
  In: Microscopy and Microanalysis 27 (2021), p. 835-848
  ISSN: 1431-9276
  DOI: 10.1017/S1431927621012083
  BibTeX: Download
• Savitzky BH., Zeltmann SE., Hughes LA., Brown HG., Zhao S., Pelz PM., Pekin TC., Barnard ES., Donohue J., Dacosta LR., Kennedy E., Xie Y., Janish MT., Schneider MM., Herring P., Gopal C., Anapolsky A., Dhall R., Bustillo KC., Ercius P., Scott MC., Ciston J., Minor AM., Ophus C.:
  Py4DSTEM: A Software Package for Four-Dimensional Scanning Transmission Electron Microscopy Data Analysis
  In: Microscopy and Microanalysis 27 (2021), p. 712-743
  ISSN: 1431-9276
  DOI: 10.1017/S1431927621000477
  BibTeX: Download

2017

• Pelz PM., Qiu WX., Buecker R., Kassier G., Miller RJD.:
  Low-dose cryo electron ptychography via non-convex Bayesian optimization
  In: Scientific Reports 7 (2017), Article No.: 9883
  ISSN: 2045-2322
  DOI: 10.1038/s41598-017-07488-y
  BibTeX: Download

2014

• Gaire B., Lee SY., Haxton DJ., Bocharova I., Sturm FP., Gehrken N., Honig M., Pitzer M., Metz D., Kim H-., Schoeffler M., Doerner R., Gassert H., Zeller S., Voigtsberger J., Cao W., Zohrabi M., Williams J., Gatton A., Reedy D., Nook C., Mueller T., Landers AL., Cocke CL., Ben-Itzhak I., Jahnke T., Belkacem A., Weber T., Pelz PM.:
  Photo-double-ionization of ethylene and acetylene near threshold
  In: Physical Review A - Atomic, Molecular, and Optical Physics 89 (2014), Article No.: 013403
  ISSN: 1094-1622
  DOI: 10.1103/PhysRevA.89.013403
  BibTeX: Download
• Pelz PM., Guizar-Sicairos M., Thibault P., Johnson I., Holler M., Menzel A.:
  On-the-fly scans for X-ray ptychography
  In: Applied Physics Letters 105 (2014), Article No.: 251101
  ISSN: 0003-6951
  DOI: 10.1063/1.4904943
  BibTeX: Download