News

It’s springtime! It’s pollen season! The little guy in the image is a daisy pollen, which grows into a beautiful small flower. The image was acquired in a dual-beam scanning electron microscope / focused ion beam (SEM/FIB) instrument. The eyes and mouth were ion milled and the image was acquired us...

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What looks like the microscopist’s version of the search for the needle in the haystack is in reality a scanning electron microscopy (SEM) image depicting several overlapping silver nanowires (AgNWs). These wires exhibit a diameter of roughly 35 nm and a length of several microns. The shown AgNW net...

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We recently published the manuscript titled "3D analysis of equally X-ray attenuating mineralogical phases utilizing a correlative tomographic workflow across multiple length scales" in the journal Powder Technology demonstrating an interdisciplinary collaboration between the IMN and the groups of P...

Category: Allgemein, News, Papers

The PhD defense of Mr. Birk Fritsch took place on 20. Feb. 2023, in the seminar room of the IZNF building. With his outstanding work “Quantification of electron beam-induced effects during in situ liquid-phase transmission electron microscopy“, he has been awarded the title Dr.-Ing. with distinction...

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This image reminds us on confetti, which fits to the carnival season! Every color represents a specific in-plane orientation of the nano-crystallites. This orientation mapping of AlN crystallites was acquired with 4D-STEM, an advanced technique collecting the electron diffraction patterns at each p...

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Even though there is not enough snow surrounding us in nature, we at least have an image that reminds us of snowflakes. These “snowflakes” are dendritic silver patches synthesized in the group of Prof. Robin Klupp Taylor, Institute of Particle Technology. The image was acquired using the scanning t...

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We wish you a Merry Christmas and a Happy New Year! We are looking forward to sharing our calendar 2023 with you online. Every month a fascinating microscopy image will be revealed reflecting the research of IMN and CENEM. The cover picture shows an electron diffraction image of TiS2, a layere...

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Following the successful past two Sino-European Early Career Researchers Virtual Workshop on Emerging Techniques and Applications in Electron Microscopy (SEEM) that attracted 300+ registrations from 20+ countries and 100+ organisations in 2020 and 2021, respectively, we are pleased to announce that ...

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